产品概述
The SCANSTA111MT/NOPB is an enhanced SCAN Bridge extends the IEEE Std. 1149.1 test bus into a multi-drop test bus environment. The advantage of a multi-drop approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. Each SCANSTA111 supports up to 3 local IEEE 1149.1 scan rings which can be accessed individually or combined serially. Addressing is accomplished by loading the instruction register with a value matching that of the slot inputs. Backplane and inter-board testing can easily be accomplished by parking the local TAP Controllers in one of the stable TAP Controller states via a Park instruction. The 32-bit TCK counter enables built in self-test operations to be performed on one port while other scan chains are simultaneously tested.
- True IEEE 1149.1 hierarchical and multidrop addressable capability
- 7 slot inputs support up to 121 unique addresses
- 3 IEEE 1149.1 Compatible configurable local scan ports
- Mode register0 allows local TAPs to be bypassed
- LSP ACTIVE Outputs provide local port enable signals for analogue busses supporting IEEE 1149.4
- General purpose local port pass-through bits
- Known power-up state
- TRST on all local scan ports
- 32-bit TCK Counter
- 16-bit LFSR Signature compactor
- Power-OFF high impedance inputs and outputs
- Supports live insertion/withdrawal
- Green product and no Sb/Br
应用
工业, 通信与网络
产品信息
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- 增强SCAN Bridge多点寻址IEEE 1149.1 (JTAG)端口
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- 3V
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- 3.6V
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- TSSOP
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- 48引脚
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- -40°C
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- 85°C
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- MSL 2 - 1年